intellectual
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Intellectual property metering
Abstract. We have developed the first hardware and software (intellectual property) metering scheme that enables reliable low overhead proofs for the number of manufactured parts and copied programs. The key idea is to make each design slightly different d
Intellectual Property Metering
Farinaz Koushanfar1, Gang Qu2, Miodrag Potkonjak3
1 EECS Dept., UC Berkeley, Berkeley, CA 94720 {farinaz@eecs.berkeley.edu}
2 ECE Dept., University of Maryland, College Park, MD 20742 {gangqu@eng.umd.edu}
3 CS Dept., UCLA, Los Angeles, CA 90095 {
Intellectual property metering
Abstract. We have developed the first hardware and software (intellectual property) metering scheme that enables reliable low overhead proofs for the number of manufactured parts and copied programs. The key idea is to make each design slightly different d
Intellectual Property Metering
Farinaz Koushanfar1, Gang Qu2, Miodrag Potkonjak3
1 EECS Dept., UC Berkeley, Berkeley, CA 94720 {farinaz@eecs.berkeley.edu}
2 ECE Dept., University of Maryland, College Park, MD 20742 {gangqu@eng.umd.edu}
3 CS Dept., UCLA, Los Angeles, CA 90095 {