IEEE standard for Terminology and Test methods for ADC Std 1

IEEE Std1241-2000 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

Sponsor

Waveform Measurement and Analysis Technical Committee

of the

of the

IEEE Instrumentation and Measurement Society

Approved7December2000

IEEE-SA Standards Board

Abstract:IEEE Std1241-2000identifies analog-to-digital converter(ADC)error sources and provides test methods with which to perform the required error measurements.The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices,as well as providing a template for writing specifications for the procurement of new ones.In some applications,the information provided by the tests described in this standard can be used to correct ADC errors, e.g.,correction for gain and offset errors.This standard also presents terminology and definitions to aid the user in defining and testing ADCs.

Keywords:ADC,A/D converter,analog-to-digital converter,digitizer,terminology,test methods

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Copyright?2001by the Institute of Electrical and Electronics Engineers,Inc.

All rights reserved. Published 13 June 2001. Printed in the United States of America.

Print:ISBN0-7381-2724-8SH94902

PDF:ISBN0-7381-2725-6SS94902

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Introduction

(This introduction is not a part of IEEE Std1241-2000,IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters.)

This standard de?nes the terms,de?nitions,and test methods used to specify,characterize,and test analog-to-digital converters(ADCs).It is intended for the following:

—Inpiduals and organizations who specify ADCs to be purchased

—Inpiduals and organizations who purchase ADCs to be applied in their products —Inpiduals and organizations whose responsibility is to characterize and write reports on ADCs available for use in speci?c applications

—Suppliers interested in providing high-quality and high-performance ADCs to acquirers

This standard is designed to help organizations and inpiduals

—Incorporate quality considerations during the de?nition,evaluation,selection,and acceptance of supplier ADCs for operational use in their equipment

—Determine how supplier ADCs should be evaluated,tested,and accepted for delivery to end users This standard is intended to satisfy the following objectives:

—Promote consistency within organizations in acquiring third-party ADCs from component suppliers

—Provide useful practices on including quality considerations during acquisition planning —Provide useful practices on evaluating and qualifying supplier capabilities to meet user requirements

—Provide useful practices on evaluating and qualifying supplier ADCs

—Assist inpiduals and organizations judging the quality and suitability of supplier ADCs for referral to end users

Several standards have previously been written that address the testing of analog-to-digital converters either directly or indirectly.These include

—IEEE Std1057-1994a,which describes the testing of waveform recorders.This standard has been used as a guide for many of the techniques described in this standard.

—IEEE Std746-1984[B16]b,which addresses the testing of analog-to-digital and digital-to-analog converters used for PCM television video signal processing.

—JESD99-1[B21],which deals with the terms and de?nitions used to describe analog-to-digital and digital-to-analog converters.This standard does not include test methods.

IEEE Std1241-2000for analog-to-digital converters is intended to focus speci?cally on terms and de?nitions as well as test methods for ADCs for a wide range of applications.

a Information on references can be found in Clause2.

b The numbers in brackets correspond to those in the bibliography in Annex C.

Copyright?2001IEEE.All rights reserved.iii

As of October2000,the working group had the following membership:

Steve Tilden,Chair

Philip Green,Secretary&Text Editor

W.Thomas Meyer,Figures Editor

Pasquale Arpaia Giovanni Chiorboli Tom Linnenbrink*

B.N.Suresh Babu Pasquale Daponte Solomon Max

Allan Belcher David Hansen Carlo Morandi

David Bergman Fred Irons Bill Peterson

Eric Blom Dan Kien Pierre-Yves Roy

Dan Knierim

*Chairman,TC-10Committee

Contributions were also made in prior years by:

Jerry Blair John Deyst Norris Nahman

William Boyer Richard Kromer Otis M.Solomon

Steve Broadstone Yves Langard T.Michael Souders

The following members of the balloting committee voted on this standard:

Pasquale Arpaia Pasquale Daponte W.Thomas Meyer

Suresh Babu Philip Green Carlo Morandi

Eric Blom Fred Irons William E.Peterson

Steven Broadstone Dan Knierim Pierre-Yves Roy

Giovanni Chiorboli T.E.Linnenbrink Steven J.Tilden

Solomon Max

When the IEEE-SA Standards Board approved this standard on21September2000,it had the following membership:

Donald N.Heirman,Chair

James T.Carlo,Vice-Chair

Judith Gorman,Secretary

Satish K.Aggarwal James H.Gurney James W.Moore

Mark D.Bowman Richard J.Holleman Robert F.Munzner

Gary R.Engmann Lowell G.Johnson Ronald C.Petersen

Harold E.Epstein Robert J.Kennelly Gerald H.Peterson

6517e60e7cd184254b353505ndis Floyd Joseph L.Koepfinger*John B.Posey

Jay Forster*Peter H.Lips Gary S.Robinson

Howard M.Frazier L.Bruce McClung Akio Tojo

Ruben D.Garzon Daleep C.Mohla Donald W.Zipse

*Member Emeritus

Also included are the following nonvoting IEEE-SA Standards Board liaisons:

Alan Cookson,NIST Representative

Donald R.Volzka,TAB Representative

Don Messina

IEEE Standards Project Editor

iv Copyright?2001IEEE.All rights reserved.

Contents

1.Overview (1)

1.1Scope (1)

1.2Analog-to-digital converter background (2)

1.3Guidance to the user (3)

1.4Manufacturer-supplied information (5)

2.References (7)

3.De?nitions and symbols (7)

3.1De?nitions (7)

3.2Symbols and acronyms (14)

4.Test methods (18)

4.1General (18)

4.2Analog input (41)

4.3Static gain and o?set (43)

4.4Linearity (44)

4.5Noise(total) (51)

4.6Step response parameters (63)

4.7Frequency response parameters (66)

4.8Di?erential gain and phase (71)

4.9Aperture e?ects (76)

4.10Digital logic signals (78)

4.11Pipeline delay (78)

4.12Out-of-range recovery (78)

4.13Word error rate (79)

4.14Di?erential input speci?cations (81)

4.15Comments on reference signals (82)

4.16Power supply parameters (83)

Annex A(informative)Comment on errors associated with word-error-rate measurement (84)

Annex B(informative)Testing an ADC linearized with pseudorandom dither (86)

Annex C(informative)Bibliography (90)

Copyright?2001IEEE.All rights reserved.v

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