USB 插拔测试标准

Test Description Low Level Contact Resistance

Test Procedure EIA 364-23 The object of this test is to detail a standard method to measure the electrical resistance across a pair of mated contacts such that the insulating films, if present, will notbe broken or asperity melting willnot occur. EIA 364-70-Method B The object of this test procedure is to detail a standard method to assess the current carrying capacity of mated USB connector contacts.

Performance Requiremen 30(50 for "Mini-"B"connector)m ohm maximum when measured at 20 mV maximum open circuit at 100 mA. Mated test contacts must be in a connector housing..

Contact Current Rating

1.5(1 for "Mini-"B"connector)A at

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